Microelectronic Reliability: Integrity Assessment and Assurance Emiliano Pollino

ISBN: 9780890063507

Published: April 19th 1989

Hardcover

556 pages


Description

Microelectronic Reliability: Integrity Assessment and Assurance  by  Emiliano Pollino

Microelectronic Reliability: Integrity Assessment and Assurance by Emiliano Pollino
April 19th 1989 | Hardcover | PDF, EPUB, FB2, DjVu, AUDIO, mp3, RTF | 556 pages | ISBN: 9780890063507 | 8.11 Mb

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices,MoreA companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics.

Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi



Enter the sum





Related Archive Books



Related Books


Comments

Comments for "Microelectronic Reliability: Integrity Assessment and Assurance":


lifeandtimesofchantel.com

©2014-2015 | DMCA | Contact us